Description: The WVASE32 is a variable angle spectroscopic ellipsometer.  The tool is used to determine thin film thickness and optical constants.  The software supports data modeling and fitting from single film problems to complex multi-sample, multi-layer problems.

Specifications: Variable angle of incidence 60 - 90 degrees: 75-degrees is the most common angle used.  Measurements are performed in the wavelength range 420 nm - 780 nm.